Electronics Weekly puts its questions to an industry figure: Simon Payne, CEO of boundary scan test firm XJTAG
Testing
Eve and CoWare form a strategic alliance
Eve links its ZeBu emulation with CoWare Platform Architect, via the fast transactor interface supported by ZeBu with the aim of cutting the time and effort to verify SoC designs that mix SystemC and RTL blocks
UK firm develops handheld EMC susceptibility tester
Buxton-based design consultancy dBTech has developed a handheld EMC susceptibility tester, claiming it can locate weakness to individual tracks, and is unlike anything else available
Tektronix target of $2.8bn takeover by Danaher
Tektronix is the target of a takeover move by US instrumentation firm Danaher in a deal that would value the electronics test company at $2.8bn
Tektronix software peers inside data link chips
Tektronix has introduced software that allows engineers to peer inside data link chips.
Tektronix logic analyser gets PCI Express
Tektronix has introduced two PCI Express 2.0 Test modules for its TLA7000 logic analyser mainframe, which also fit its TLA7002 portable mainframe
Serial data buses under test
Engineers are working on products incorporating serial bus technologies and are relying on evolving specifications and test methodologies
Mixed signal scopes are key to fast system debug
Applications that help engineers exploit the digital measurement capabilities of mixed signal scopes are a catalyst for shorter development cycles and higher quality designs, says Joel Woodward.
Multi-core processor design gets speed boost
National Instruments' latest LabVIEW graphical tool will speed design of multi-core embedded processor systems
Mobile device manufacturers face increasing test demands
"The carriers are now beginning to exert their muscle beyond certification, implementing their own schemes for accepting devices"