Electronics Weekly
The seminar objective is to provide an overview of the state-of-art techniques used to measure the impedance and the dielectric properties of materials that are widely incorporated into microwave devices and components.
It will start from the basis of measuring the impedance of components and material following an overview of the most relevant techniques used to measure large range of materials from few MHz to THz.
It will look at techniques to measure impedance at nanoscale and at very high frequency using novel technologies.
Content that will be covered includes:
- Challenges and Solution for Impedance Measurement
- Novel Devices and Material Characterisation at mm-wave and Terahertz
- Investigation of local electrical properties at the nanoscale using Scanning Microwave Microscopy (SMM)
The seminar is applicable for engineers working in R&D, QA, Design and Manufacturing Engineers.
Agenda
8.45 – Welcome & Registration
9.00 – Challenges and Solution for Impedance Measurement
10.30 – Break
10.45 – Novel Devices and Material Characterisation at mm-wave and Terahertz
12.15 – Lunch
13.00 – Investigation of local electrical properties at the nanoscale using Scanning Microwave Microscopy (SMM)
14.30 – Close
